• DocumentCode
    490659
  • Title

    Real-Time Control of Rapid Thermal Processing Semiconductor Manufacturing Equipment

  • Author

    Schaper, Charles D.

  • Author_Institution
    Department of Electrical Engineering, Stanford University, Stanford, CA 94305
  • fYear
    1993
  • fDate
    2-4 June 1993
  • Firstpage
    2985
  • Lastpage
    2990
  • Abstract
    A real-time multivariable control system has been developed for rapid thermal processing (RTP) semiconductor manufacturing equipment. The controller has been used for spatial and temporal temperature control of a semiconductor wafer. The control system, originally developed for prototype equipment at Stanford University, has been transferred and customized for operation on seven on-line RTP reactors at Texas Instruments (Dallas). The control system has been used for more than 5,000 process runs comprising thirteen different thermal fabrication steps of two sub-half-micron CMOS process technologies.
  • Keywords
    Control systems; Fabrication; Inductors; Instruments; Manufacturing processes; Prototypes; Rapid thermal processing; Real time systems; Semiconductor device manufacture; Temperature control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 1993
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-0860-3
  • Type

    conf

  • Filename
    4793450