DocumentCode
490659
Title
Real-Time Control of Rapid Thermal Processing Semiconductor Manufacturing Equipment
Author
Schaper, Charles D.
Author_Institution
Department of Electrical Engineering, Stanford University, Stanford, CA 94305
fYear
1993
fDate
2-4 June 1993
Firstpage
2985
Lastpage
2990
Abstract
A real-time multivariable control system has been developed for rapid thermal processing (RTP) semiconductor manufacturing equipment. The controller has been used for spatial and temporal temperature control of a semiconductor wafer. The control system, originally developed for prototype equipment at Stanford University, has been transferred and customized for operation on seven on-line RTP reactors at Texas Instruments (Dallas). The control system has been used for more than 5,000 process runs comprising thirteen different thermal fabrication steps of two sub-half-micron CMOS process technologies.
Keywords
Control systems; Fabrication; Inductors; Instruments; Manufacturing processes; Prototypes; Rapid thermal processing; Real time systems; Semiconductor device manufacture; Temperature control;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference, 1993
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-0860-3
Type
conf
Filename
4793450
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