General Methodologies for Assessing EMI/EMC in Complex Electronic Circuits and Systems

This paper introduces the procedures for utilizing two techniques, namely Fault Tree Analysis (FTA) and Electromagnetic Effects Criticality Analysis (EMECA), for assessing EMI/EMC in complex electronic circuits and systems. Application of these techniques are demonstrated by means of examples where, because of the use of digital, high-speed, high-density integrated circuit technologies, EMI/EMC assessments by traditional deterministic methods are inappropriate. The results illustrate the probability of achieving EMC while accounting for the statistical nature of EMI.