DocumentCode
491219
Title
Performance Analysis of Multiple Chips Per Symbol M-ary FSK in Fast, Slow and Partially Correlated Rayleigh Fading
Author
Gong, K.S.
Author_Institution
RAYTHEON COMPANY, MARLBOROUGH, MA 01752
Volume
2
fYear
1987
fDate
19-22 Oct. 1987
Abstract
Error rate performance analysis is presented in this paper for the multiple chips per symbol M-ary FSK in the fast, slow and partially correlated Rayleigh fading environments. Exact error rate expressions are given for the three fading situations considered. Numerical results are provided for the 8-FSK waveform. Error performance with forward error control coding is also presented to show the improvement over the uncoded cases. These results have direct application to the design of ionospheric communication systems.
Keywords
Covariance matrix; Decorrelation; Error analysis; Error correction; Fading; Frequency shift keying; Genetic expression; Performance analysis; Random variables; Rayleigh channels;
fLanguage
English
Publisher
ieee
Conference_Titel
Military Communications Conference - Crisis Communications: The Promise and Reality, 1987. MILCOM 1987. IEEE
Conference_Location
Washington, DC, USA
Type
conf
DOI
10.1109/MILCOM.1987.4795295
Filename
4795295
Link To Document