DocumentCode :
49201
Title :
At-Speed Distributed Functional Testing to Detect Logic and Delay Faults in NoCs
Author :
Kakoee, Mohammad ; Bertacco, Valeria ; Benini, Luca
Author_Institution :
Dept. of DEIS, Univ. of Bologna, Bologna, Italy
Volume :
63
Issue :
3
fYear :
2014
fDate :
Mar-14
Firstpage :
703
Lastpage :
717
Abstract :
In this work, we propose a distributed functional test mechanism for NoCs which scales to large-scale networks with general topologies and routing algorithms. Each router and its links are tested using neighbors in different phases. The router under test is in test mode while all other parts of the NoC are operational. We use triple module redundancy (TMR) for the robustness of all testing components that are added into the switch. Experimental results show that our functional test approach can detect stuck-at, short and delay faults in the routers and links. Our approach achieves 100 percent stuck-at fault coverage for the data path and 85 percent for the control paths including routing logic, FIFO´s control path, and the arbiter of a 5 × 5 router. We also show that our approach is able to detect delay faults in critical control and data paths. Synthesis results show that the area overhead of our test components with TMR support is 20 percent for covering stuck-at, delay, and short-wire faults and 7 percent for covering only stuck-at and delay faults in the 5 × 5 router. Simulation results show that our online testing approach has an average latency overhead of 3 percent in PARSEC traffic benchmarks on an 8 × 8 NoC.
Keywords :
circuit switching; fault diagnosis; integrated circuit testing; network routing; network-on-chip; FIFO; NoCs; PARSEC traffic benchmarks; TMR; arbiter; at-speed distributed functional testing; control path; critical control; data paths; delay fault detection; distributed functional test mechanism; functional test approach; general topologies; large-scale networks; links; logic fault detection; router; routing algorithms; routing logic; short fault detection; stuck-at fault coverage; stuck-at fault detection; switch; triple module redundancy; Circuit faults; Delays; Logic gates; Routing; Switches; Testing; Wires; NoC testing; delay fault; functional test; online testing;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.2013.202
Filename :
6631422
Link To Document :
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