DocumentCode :
492102
Title :
Image Reconstruction Using OS-EM Method in Cone-beam CT
Author :
Dong, Baoyu
Author_Institution :
Sch. of Electr. & Inf., Dalian Jiaotong Univ., Dalian
fYear :
2008
fDate :
21-22 Dec. 2008
Firstpage :
108
Lastpage :
111
Abstract :
Traditional CT reconstructions are limited by many kinds of artifacts, and they give dissatisfactory image. To reduce image noise and artifacts, we propose a statistical iterative method for image reconstruction in cone-beam CT. First the theory of maximum likelihood estimation (MLE) is extended from emission CT to X-ray scan, then an expectation-maximization (EM) formula is deduced for direct reconstruction of cone-beam CT. EM algorithm is an iterative method that can produce good quality reconstruction, but compared with fast and robust FDK algorithm, EM algorithm is computer intensive and convergence slow. In order to accelerate the convergence speed of EM algorithm, ordered subset (OS) is applied in Cone-beam CT. Experimental results with computer simulated data and real CT data show that OS-EM algorithm can provide good quality reconstructions after only a few iterations. In addition, the point spread function of the OS-EM algorithm is analyzed for evaluating the imaging system performance.
Keywords :
X-ray microscopy; computerised tomography; expectation-maximisation algorithm; image reconstruction; iterative methods; medical image processing; optical transfer function; set theory; OS-EM method; X-ray scan; computed tomography; cone-beam CT; expectation-maximization formula; image reconstruction; maximum likelihood estimation; ordered subset; point spread function; statistical iterative method; Acceleration; Computed tomography; Convergence; Image reconstruction; Iterative algorithms; Iterative methods; Maximum likelihood estimation; Noise reduction; Robustness; X-ray imaging; Cone-beam CT; Image reconstruction; MLE; OS-EM algorithm;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Knowledge Acquisition and Modeling Workshop, 2008. KAM Workshop 2008. IEEE International Symposium on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-3530-2
Electronic_ISBN :
978-1-4244-3531-9
Type :
conf
DOI :
10.1109/KAMW.2008.4810436
Filename :
4810436
Link To Document :
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