DocumentCode :
4923
Title :
History of GaN: High-Power RF Gallium Nitride (GaN) from Infancy to Manufacturable Process and Beyond
Author :
Runton, D.W. ; Trabert, B. ; Shealy, James B. ; Vetury, Rama
Author_Institution :
RFMD, Chandler, AZ, USA
Volume :
14
Issue :
3
fYear :
2013
fDate :
imsspecialissuemay 2013
Firstpage :
82
Lastpage :
93
Abstract :
In the early 1990s, gallium nitride (GaN) was deemed an excellent, next generation, semiconductor material for high power/high frequency transistors based on the material parameters of bandgap, electron mobility, and saturated electron velocity. The lack of bulk GaN source material led to the need for GaN growth on mismatched substrates such as Si, SiC and sapphire, but fundamental material development controlled the pace of maturation of GaN technology for both electronic and optoelectronic applications. The development of GaN for RF electronics was significantly aided by the intense development that occurred in the race to first production of blue and, eventually, white light-emitting diodes (LEDs). Ultimately, advancements in the growth of device-grade aluminum gallium nitride (AlGaN)/GaN heterostructures culminated in the demonstration of record power density RF amplifiers.
Keywords :
III-V semiconductors; MOSFET; aluminium compounds; electron mobility; gallium compounds; light emitting diodes; radiofrequency amplifiers; semiconductor growth; semiconductor heterojunctions; wide band gap semiconductors; AlGaN-GaN; RF electronics; bandgap material parameters; bulk source material; device-grade heterostructures; electron mobility; electronic applications; high power-high frequency transistors; high-power RF gallium nitride; manufacturable process; next generation semiconductor material; optoelectronic applications; power density RF amplifiers; saturated electron velocity; white LED; white light-emitting diodes; Aluminum gallium nitride; Gallium nitride; Next generation networking; Photonic band gap; Semiconductor materials; Transistors;
fLanguage :
English
Journal_Title :
Microwave Magazine, IEEE
Publisher :
ieee
ISSN :
1527-3342
Type :
jour
DOI :
10.1109/MMM.2013.2240853
Filename :
6492190
Link To Document :
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