DocumentCode :
492704
Title :
An all-digital phase-locked loop with fast acquisition and low jitter
Author :
Zhao, Jun ; Kim, Yong-Bin
Author_Institution :
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA
Volume :
01
fYear :
2008
fDate :
24-25 Nov. 2008
Abstract :
An all-digital phase-locked loop that achieves fast acquisition and low jitter was developed for high-speed clock generation. By employing a time-to-digital converter (TDC), the frequency difference is precisely measured and converted to the control word of the digital oscillator. Using this feature, the ADPLL has a faster lock-in time than previous digital phaselocked loops. The ADPLL was implemented using a 0.9 V 32 nm practical transistor model (PTM). The simulation results show that the proposed ADPLL achieves 5 and 10 reference cycles of frequency and phase acquisitions at 700 MHz with peak to peak jitter < 53 ps.
Keywords :
analogue-digital conversion; digital phase locked loops; phase locked oscillators; timing jitter; all-digital phase-locked loop; digital oscillator; fast acquisition; frequency 700 MHz; high-speed clock generation; lock-in time; low jitter; phase acquisitions; practical transistor model; size 32 nm; time-to-digital converter; voltage 0.9 V; Circuit noise; Clocks; Detectors; Frequency conversion; Jitter; Phase locked loops; Shift registers; Signal generators; Switches; Working environment noise; ADPLL; DCO; Time-to-digital converter;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SoC Design Conference, 2008. ISOCC '08. International
Conference_Location :
Busan
Print_ISBN :
978-1-4244-2598-3
Electronic_ISBN :
978-1-4244-2599-0
Type :
conf
DOI :
10.1109/SOCDC.2008.4815626
Filename :
4815626
Link To Document :
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