• DocumentCode
    492762
  • Title

    Crosstalk avoidance method considering multi-aggressors

  • Author

    Jung, Sibaek ; Zang, Naeun ; Park, Eunsuk ; Kim, Juho

  • Author_Institution
    Design Autom. Team, Hynix Semicond. Inc., Icheon
  • Volume
    02
  • fYear
    2008
  • fDate
    24-25 Nov. 2008
  • Abstract
    This As manufacturing technology scales to smaller dimensions, wire size is increasing and spacing between wires is decreasing, the influence of interconnect becomes dominant factor. Coupling capacitance between wires induces crosstalk. Crosstalk causes functional and temporal problem. In this paper, we propose timing window shift method considering multi-aggressors to reduce delay degradation. We assume that crosstalk induced delay degradation is proportional to coupling capacitance and timing window overlap. In this assumption, we model Aggressive Factor which represents the amount of crosstalk induced delay degradation. Proposed method is experimented with ISCAS85 benchmark circuit. We have a result that average of 4.85% crosstalk induced delay degradation minimization.
  • Keywords
    capacitance; crosstalk; delays; interconnections; logic gates; ISCAS85 benchmark circuit; aggressive factor; coupling capacitance; crosstalk avoidance method; delay degradation; interconnect; multi-aggressors; timing window shift method; Capacitance; Coupling circuits; Crosstalk; Degradation; Delay; Integrated circuit interconnections; Manufacturing; Minimization; Timing; Wires; crosstalk; multi-aggressors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SoC Design Conference, 2008. ISOCC '08. International
  • Conference_Location
    Busan
  • Print_ISBN
    978-1-4244-2598-3
  • Electronic_ISBN
    978-1-4244-2599-0
  • Type

    conf

  • DOI
    10.1109/SOCDC.2008.4815708
  • Filename
    4815708