Title :
A programmable memory BIST for embedded memory
Author :
Hong, WonGi ; Choi, JungDai ; Chang, Hoon
Author_Institution :
Dept. of Comput., Soongsil Univ., Seoul
Abstract :
Recent development in System-on-Chip(SOC) technology makes it possible to incorporate large embedded memories into a chip. However, it also complicates the test process, since usually the embedded memories cannot be controlled from the external environment. Thus, the proposed scheme supports the various memory test algorithms to test different types of memory modules in SOC. Moreover, it is able to At-speed test in a memory module. Consequently, the proposed is more efficient in terms of test cost.
Keywords :
built-in self test; digital storage; embedded systems; finite state machines; integrated circuit testing; memory architecture; modules; system-on-chip; embedded memory; finite-state-machine-based BIST architecture; memory modules; memory test algorithms; programmable memory BIST; system-on-chip technology; Algorithm design and analysis; Automatic testing; Built-in self-test; Costs; Electronic mail; Embedded computing; Fault detection; Life testing; Manufacturing; Read-write memory; BIST; Ebmedded memory; Programmable;
Conference_Titel :
SoC Design Conference, 2008. ISOCC '08. International
Conference_Location :
Busan
Print_ISBN :
978-1-4244-2598-3
Electronic_ISBN :
978-1-4244-2599-0
DOI :
10.1109/SOCDC.2008.4815717
