Title :
Electronic apparatus automation inspection with adaptive clustering in wavelet domain
Author :
Shcherbakova, Galina ; Krylov, V. ; Antoshchuk, Svetlana
Author_Institution :
Odessa Nat. Polytech. Univ., Odessa, Ukraine
Abstract :
The adaptive clustering in hyperbolic wavelet transforming domain is designed. Such approach allows inspected the production process of electronic apparatus in case of parameters correlation and high level noise.
Keywords :
automatic testing; electronic products; inspection; wavelet transforms; adaptive clustering; automatic inspection; electronic apparatus automation inspection; electronic apparatus production; hyperbolic wavelet transforming domain; parameter correlation; Clustering methods; Design automation; Inspection; Iterative methods; Manufacturing; Noise level; Optimization methods; Production; Programmable control; Wavelet domain; Adaptive clustering; electronic apparatus production control; hyperbolic wavelet transforming (HWT); noise;
Conference_Titel :
CAD Systems in Microelectronics, 2009. CADSM 2009. 10th International Conference - The Experience of Designing and Application of
Conference_Location :
Lviv-Polyana
Print_ISBN :
978-966-2191-05-9
