DocumentCode
492895
Title
Application of multiple observation time strategy in test generation of digital sequential circuits
Author
Skobtsov, Yu.A. ; Skobtsov, V.Yu. ; Hindi, S.N.
Author_Institution
CADS Dept., Donetsk Nat. Tech. Univ., Donetsk, Ukraine
fYear
2009
fDate
24-28 Feb. 2009
Firstpage
357
Lastpage
360
Abstract
The test generation method is designed for digital circuits with memory on the basis of distinguishing state pairs of good and fault devices. The multiple observation time test strategy, 16-valued alphabet and genetic algorithms are used . The proposed method permits to cover the faults that are not detected with traditional methods. It increases the fault coverage.
Keywords
genetic algorithms; logic testing; sequential circuits; digital sequential circuits; genetic algorithms; multiple observation time strategy; test generation; Analytical models; Circuit testing; Concrete; Data processing; Filtration; Mathematical model; Neurons; Sequential analysis; Sequential circuits; Stochastic resonance; CAD; Genetic algorithms; Test generation;
fLanguage
English
Publisher
ieee
Conference_Titel
CAD Systems in Microelectronics, 2009. CADSM 2009. 10th International Conference - The Experience of Designing and Application of
Conference_Location
Lviv-Polyana
Print_ISBN
978-966-2191-05-9
Type
conf
Filename
4839850
Link To Document