DocumentCode
493271
Title
New fabrication method of micro-pyramidal vertical probe array for probe cards
Author
Lin, Tsung-Hung ; Yang, Hsihamg ; Chao, Ching-Kong
Author_Institution
Dept. of Mech. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei
fYear
2009
fDate
1-3 April 2009
Firstpage
122
Lastpage
126
Abstract
This paper presents a novel and precision process to fabricate an array of micro metal vertical probes with various tip angles. The process includes an inclined and multiple ultraviolet (UV) lithography, contact lithography and Ni electroforming technology. The tips of micro pyramid vertical probe array utilize the inclined and multiple exposures cooperated with Snell´s law. Due to the light pass through an optical transparent homogenous material, the material refractive index results in light path deflection. By changing the workpiece inclination, controllable various tip angles can be fabricated. The experimental results showed that micro metal vertical probes with 54deg, 60deg and 68deg tip angles. The micro-pyramidal vertical probe array can be used in vertical-type probe cards without the conventional complicated assembly.
Keywords
electroforming; micro-optomechanical devices; probes; refractive index; ultraviolet lithography; Snell law; contact lithography; electroforming; light path deflection; micro-pyramidal vertical probe array; probe cards; refractive index; ultraviolet lithography; workpiece inclination; Costs; Etching; Fabrication; Lithography; Optical materials; Optical refraction; Plasma applications; Plasma materials processing; Probes; Refractive index;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Test, Integration & Packaging of MEMS/MOEMS, 2009. MEMS/MOEMS '09. Symposium on
Conference_Location
Rome
Print_ISBN
978-1-4244-3874-7
Type
conf
Filename
4919475
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