• DocumentCode
    49330
  • Title

    Analysis of Buckling Strength of Inner Windings in Transformers Under Radial Short-Circuit Forces

  • Author

    Bakshi, Ankita ; Kulkarni, S.V.

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol. Bombay, Mumbai, India
  • Volume
    29
  • Issue
    1
  • fYear
    2014
  • fDate
    Feb. 2014
  • Firstpage
    241
  • Lastpage
    245
  • Abstract
    The buckling of conductors of inner windings in transformers is one of the major causes of their failures. It can occur when a large magnitude of radial short-circuit electromagnetic force acts on them. In this paper, initially, mechanical strains developed during winding processes and due to radial short-circuit forces have been determined. The two mechanical strains viz. the short-circuit induced strain and the winding process-induced strain are algebraically added to obtain their resulting strain. The stress corresponding to the resulting strain has been determined by using the Ramberg-Osgood stress-strain relation. The critical buckling stress has been calculated and compared with the resulting stress. The analytically obtained result of the strain induced in the winding conductor during its winding process has been verified using the finite-element method. A case study has been described in which the factor of safety against the buckling strength is determined.
  • Keywords
    buckling; finite element analysis; mechanical strength; power transformers; stress-strain relations; transformer windings; Ramberg-Osgood stress-strain relation; buckling strength analysis; critical buckling stress; finite-element method; mechanical strains; radial short-circuit electromagnetic force; short-circuit induced strain; transformer inner windings; winding conductor; winding process-induced strain; Conductors; Materials; Power transformers; Safety; Strain; Stress; Windings; Buckling; short-circuit force; strain; stress; transformers;
  • fLanguage
    English
  • Journal_Title
    Power Delivery, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8977
  • Type

    jour

  • DOI
    10.1109/TPWRD.2013.2272102
  • Filename
    6563173