DocumentCode :
493312
Title :
Modeling of an electrostatic torsional micromirror for laser projection system
Author :
Marchetti, Eleonora ; Volpi, Emilio ; Battini, Francesco ; Bacciarelli, Luca ; Fanucci, Luca ; De Marinis, Marco ; Hofmann, Ulrich
Author_Institution :
Dept. of Inf. Eng., Univ. of Pisa, Pisa
fYear :
2009
fDate :
1-3 April 2009
Firstpage :
182
Lastpage :
186
Abstract :
This paper presents the Simulinktrade model of a new 2D torsional scanning micromirror. This Micro-Opto-Electro-Mechanical-System (MOEMS) is very important towards the integration into a system on a package of a complete laser projection system. Modeling and simulation of the MOEMS is a key point for the development of the proper micromirror electronic conditioning interface thus reducing time to market and production costs. In literature there are not exhaustive examples of complete characterizations of 2D torsional scanning micromirrors. The aim of this work is to develop a Simulinktrade model which incorporates the main mechanical and electrostatic parameters of the sensor such as the resonance frequency, the torsional constant and capacitance versus rotation angle characteristic. This model has been successfully verified via experimental measurements and it proved his effectiveness in the development of the relevant electronic conditioning circuitry.
Keywords :
integrated optoelectronics; micro-optomechanical devices; micromirrors; 2D torsional scanning micromirrors; Simulinktrade model; electrostatic torsional micromirror; laser projection system; microopto-electro-mechanical-system; Capacitive sensors; Consumer electronics; Costs; Electronics packaging; Electrostatics; Laser modes; Mechanical sensors; Micromirrors; Production; Time to market;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Test, Integration & Packaging of MEMS/MOEMS, 2009. MEMS/MOEMS '09. Symposium on
Conference_Location :
Rome
Print_ISBN :
978-1-4244-3874-7
Type :
conf
Filename :
4919516
Link To Document :
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