DocumentCode :
493330
Title :
Investigation of key technologies for System-in-Package integration of inertial MEMS
Author :
Marenco, N. ; Reinert, W. ; Warnat, S. ; Lange, P. ; Gruenzig, S. ; Allegato, G. ; Hillmann, G. ; Kostner, H. ; Gal, W. ; Guadagnuolo, S. ; Conte, A. ; Malecki, K. ; Friedel, K.
Author_Institution :
Fraunhofer Inst. for Silicon Technol., Itzehoe
fYear :
2009
fDate :
1-3 April 2009
Firstpage :
35
Lastpage :
40
Abstract :
ldquoSystem-in-Packagerdquo is a key concept to achieve minimum size and costs in hybrid integration. We investigated several related technologies for inertial sensor MEMS packaging, with special emphasis on vacuum packaging of resonant devices like gyroscopes: Hermetic Chip-to-Wafer and Wafer-to-Wafer bonding, Through-Silicon Via in thick and in thin wafers, thin-film getter deposition and fine patterning, and full-wafer transfer molding. This paper shows the achievements of the project after finalizing the main R&D activities. Currently, we are attempting the full flow implementation on functional devices.
Keywords :
microsensors; moulding; system-in-package; fine patterning; full-wafer transfer molding; functional devices; gyroscopes:; hermetic chip-to-wafer bonding; inertial sensor MEMS packaging; resonant devices; system-in-package integration; vacuum packaging; wafer-to-wafer bonding; Costs; Gyroscopes; Micromechanical devices; Packaging; Resonance; Sputtering; Thin film devices; Thin film sensors; Vacuum technology; Wafer bonding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Test, Integration & Packaging of MEMS/MOEMS, 2009. MEMS/MOEMS '09. Symposium on
Conference_Location :
Rome
Print_ISBN :
978-1-4244-3874-7
Type :
conf
Filename :
4919535
Link To Document :
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