Title :
3D stacked MEMS and ICs in a miniaturized sensor node
Author :
Taklo, Maaike M V ; Lietaer, Nicolas ; Tofteberg, Hannah ; Seppänen, Timo ; Ramm, Peter ; Weber, Werner
Author_Institution :
SINTEF, Oslo
Abstract :
3D integration of micro electromechanical systems (MEMS) is expected to reduce the foot print of existing MEMS products and enable production of miniaturized sensor nodes on a large scale. However, 3D integration of MEMS is in general different from 3D integration of planar integrated circuits (ICs) due to additional mechanical requirements. Specifications regarding properties like stiffness, volume, and mass must be taken into consideration when selecting stacking technologies for MEMS. A demonstrator with a 3D integrated MEMS and the ideas behind the selection of stacking technologies are presented in this paper.
Keywords :
application specific integrated circuits; microsensors; 3D integration; 3D stacked MEMS; application specific integrated circuits; miniaturized sensor node; planar integrated circuits; stacking technology; Electromechanical sensors; Electromechanical systems; Foot; Integrated circuit technology; Large scale integration; Mechanical sensors; Micromechanical devices; Production systems; Sensor systems; Stacking;
Conference_Titel :
Design, Test, Integration & Packaging of MEMS/MOEMS, 2009. MEMS/MOEMS '09. Symposium on
Conference_Location :
Rome
Print_ISBN :
978-1-4244-3874-7