Title :
A New Neural Network Approach to Electronic Circuit Fault Diagnosis
Author :
Tian, WenJie ; Geng, Yu
Author_Institution :
Autom. Inst., BEIJING Union Univ., Beijing
Abstract :
To overcome the deficiencies of single neural network such as low diagnosis precision, long training time and bad generalized ability, an integrated neural network classifier is proposed for electronic circuit fault diagnosis in the paper. The investigation shows that the proposed method has higher classification precision and reliability, and is an ideal pattern classifier. Both simulation and experiment indicate that the proposed method is quite effective and ubiquitous.
Keywords :
circuit reliability; fault diagnosis; neural nets; electronic circuit; fault diagnosis; neural network; pattern classifier; reliability; Artificial intelligence; Artificial neural networks; Automation; Circuit faults; Electronic circuits; Electronic mail; Error analysis; Fault diagnosis; Neural networks; Probability; classifier; electronic circuit; fault diagnosist; integrated; neural network;
Conference_Titel :
Education Technology and Computer Science, 2009. ETCS '09. First International Workshop on
Conference_Location :
Wuhan, Hubei
Print_ISBN :
978-1-4244-3581-4
DOI :
10.1109/ETCS.2009.318