Title :
Path loss pattern prediction in Tokyo City based on deterministic ray tracing and stochastic multi-parametric approaches
Author :
Blaunstein, N. ; Katz, D. ; Hayakawa, M. ; Sanoh, Y.
Author_Institution :
Dept. of Commun. Syst., Ben-Gurion Univ. of the Negev, Be´´er-Sheva
Abstract :
This study is related to investigation of two planning tools based on the deterministic ray tracing model, as direct computations of numerous rays arriving at the receiver, and the stochastic multi-parametric model, as combination of statistical description of the built-up rough terrain, and of radio propagation accounting for multiple reflection, scattering and diffraction. Comparison between these two theoretical predictors is done for description of the total path loss pattern in urban environment and is shown that simple engineering formulas, obtained from the stochastic multi-parametric model, have vivid physical and mathematical form converted in the ldquostraight linerdquo equations.
Keywords :
radiowave propagation; ray tracing; stochastic processes; Tokyo City; deterministic ray tracing; path loss pattern prediction; radio propagation; stochastic multiparametric approaches; straight line equations; Cities and towns; Computational modeling; Diffraction; Mathematical model; Radio propagation; Ray tracing; Receivers; Reflection; Scattering; Stochastic processes;
Conference_Titel :
Antennas and Propagation, 2009. EuCAP 2009. 3rd European Conference on
Conference_Location :
Berlin
Print_ISBN :
978-1-4244-4753-4
Electronic_ISBN :
978-3-00-024573-2