Title :
Effects of RFI in switched capacitor circuits
Author :
Kanimozhi, K. ; Pandian, R. ; Booma, J.
Author_Institution :
PSNACET, Dindigul, India
Abstract :
In the last few years, the level of electromagnetic interference (EMI) has significantly increased and unwanted radio frequency (RF) voltages and currents are almost always superimposed onto nominal signals in any integrated circuit Analog and digital integrated circuits are widely used in equipment operating in electromagnetic polluted environments such as in automotive, aeronautic and industrial systems. The errors which are induced by radio-frequency interference (RFI) in switched-capacitor (SC) circuits are discussed and the main role played by the distortion of MOS switches in the on-state is highlighted. Furthermore, a new simple analytical model, which enables one to predict RFI-induced errors in SC circuits is proposed and it is validated by the comparison of its predictions with time-domain computer simulation results.
Keywords :
analogue integrated circuits; digital integrated circuits; radiofrequency interference; switched capacitor networks; MOS switches; RFI induced errors; analog integrated circuits; digital integrated circuits; electromagnetic interference; radiofrequency interference; radiofrequency voltages; switched capacitor circuits; time-domain computer simulation; Analog integrated circuits; Digital integrated circuits; Electromagnetic interference; RF signals; Radio frequency; Radiofrequency integrated circuits; Radiofrequency interference; Switched capacitor circuits; Switching circuits; Voltage; Electromagnetic compatibility (EMC); electromagnetic interference (EMI); integrated circuits (ICs); nonlinear circuit analysis; sample and hold (SH); switched capacitors (SC);
Conference_Titel :
Electromagnetic Interference & Compatibility, 2008. INCEMIC 2008. 10th International Conference on
Conference_Location :
Bangalore
Print_ISBN :
978-81-903575-1-7