Title :
Uncertainty analysis for conducted emission measurement
Author :
Chakrabarti, Satyajit ; Dan, Dipankar ; Suresh, G.
Author_Institution :
SAMEER Kolkata Centre, Kolkata, India
Abstract :
EMC measurements are inherently less accurate than most other types of measurement. Though the test houses are required to report or at least estimate their own measurement system uncertainty, there is no defined acceptable margin of uncertainty. In this paper a simple yet subtle technique to estimate the measurement uncertainty in conducted emission has been presented. The difficulty in calibrating line impedance stabilisation network (LISN) has been overcome by repeated measurement. Relevant measurement results have been presented. Overall uncertainty of conducted emission (CE) measurement has been estimated.
Keywords :
electromagnetic compatibility; measurement uncertainty; EMC measurements; conducted emission measurement; line impedance stabilisation network; measurement uncertainty; uncertainty analysis; Calibration; Electromagnetic compatibility; Frequency measurement; Impedance measurement; Insertion loss; Loss measurement; Measurement standards; Measurement uncertainty; Signal generators; System testing; Uncertainty; estimated calibration uncertainty of LISN; estimated uncertainty of CE measurement;
Conference_Titel :
Electromagnetic Interference & Compatibility, 2008. INCEMIC 2008. 10th International Conference on
Conference_Location :
Bangalore
Print_ISBN :
978-81-903575-1-7