Title :
Difficulties in measuring EMI characteristics of communication systems utilizing FH techniques
Author :
Tyagi, Satish Kumar
Author_Institution :
Defence Electron. Applic. Lab., Dehradun, India
Abstract :
The paper presents the difficulties in carrying out EMI/EMC measurements of frequency hopping (FH) transceivers caused by frequency shifting at a very high rate. New approaches such as measurements of jamming margin and process gain in the presence of interfering signals or wide band noise applied to r.f. Port and simultaneous transmission of two or more FH signals manifest a scenario that is nearer to the real threat. These approaches are also discussed in the paper.
Keywords :
electromagnetic compatibility; electromagnetic interference; frequency hop communication; intermodulation; spread spectrum communication; transceivers; EMI/EMC communication system; FH signal; FH-SS system; FH-SS technique; frequency hopping transceiver; intermodulation; spread spectrum technique; wide band noise; Electromagnetic compatibility; Electromagnetic interference; Frequency measurement; Gain measurement; Jamming; Noise measurement; Signal processing; Spread spectrum communication; Transceivers; Wideband; broadband interference; cross modulation; frequency hopping; inter modulation;
Conference_Titel :
Electromagnetic Interference & Compatibility, 2008. INCEMIC 2008. 10th International Conference on
Conference_Location :
Bangalore
Print_ISBN :
978-81-903575-1-7
