Analysis of conducted RF immunity standard

Modern electronic equipment of mostly high-speed digital circuitry, switching devices, memories & sensitive semiconductors circuits is very susceptible to electromagnetic interference (EMI). The interference may come via the power supply; signal lines control lines or earth port. It makes good sense to test products to ensure they will work reliably in their intended operating environment. This is especially important safety-related, high reliability, mission critical electronic application. Products that pass tests to all relevant immunity standards listed under the EMC directive, but nevertheless are unreliable or fail in normal use because they are not immune enough for their real-life EM environment. This paper presents the lagging of conducted RF immunity standards IEC61000-4-6 in real life environment.