Title :
Multiple Scattering centers measurements using the Kumaresan-Tufts method
Author :
Li, Shiyong ; Lv, Xin ; Sun, Houjun ; Hu, Weidong
Author_Institution :
Department of Electronic Engineering, Beijing Institute of Technology, 100081, China
Abstract :
The Kumaresan-Tufts (KT) method applied to multiple scattering centers measurements is discussed in this paper. We analyze the particular properties of the KT method which are different with the IFFT method when it is applied to the measurements. The signal zeros of a linear prediction-error filter polynomial are chosen by their locations with respect to the unit circle. Results compared with [1] show that the method used in this paper is more robust than that in [1] with respect to the changes of model order. Results compared with the IFFT method are also given out. It is shown that the precision and resolution of the KT method are both higher than those of the IFFT method. The KT method is more sensitive to noise than the IFFT method when the signal-to-noise ratio (SNR) is low. But the robustness can be significantly improved by using the mean of the estimates.
Keywords :
multiple scattering centers; singular value decomposition; step-frequency; the Kumaresan-Tufts method;
Conference_Titel :
Wireless, Mobile and Multimedia Networks, 2006 IET International Conference on
Conference_Location :
hangzhou, China
Print_ISBN :
0-86341-644-6