DocumentCode
496846
Title
An Improved Binary Tree SVM Classification Algorithm Based on Bayesian
Author
Ren, LiBin ; Chang, Huiyou ; Yi, Yang
Author_Institution
Dept. of Comput. Sci. & Technol., Sun Yet-Sen Univ., Guangzhou, China
Volume
1
fYear
2009
fDate
18-19 July 2009
Firstpage
178
Lastpage
181
Abstract
Due to the great generalization and the support of statistics, support vector machines (SVMs) has been widely applied to resolving multi-class classification problem. Numbers of multi-class SVM have been proposed. Compared with other multi-class SVM, binary tree of SVM (BTS) takes a good advantage of lower time consuming. However, there is some unnecessary data reassignment during constructing a binary tree, which makes BTS can´t resolve the high-dimensional multi-class classification problem accurately. In this paper, a bayesian-based BTS classification algorithm (b-BTS) has been proposed. Experiments demonstrated that b-BTS is superior to BTS in resolving classification problem, such as image classification problem.
Keywords
Bayes methods; pattern classification; support vector machines; trees (mathematics); bayesian-based BTS classification algorithm; high-dimensional multiclass classification problem; image classification; improved binary tree SVM classification algorithm; multiclass SVM; support vector machines; Bayesian methods; Binary trees; Classification algorithms; Classification tree analysis; Computer science; Machine learning algorithms; Statistics; Sun; Support vector machine classification; Support vector machines; bayesian; data mining; machine learning; support vector machines;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Processing, 2009. APCIP 2009. Asia-Pacific Conference on
Conference_Location
Shenzhen
Print_ISBN
978-0-7695-3699-6
Type
conf
DOI
10.1109/APCIP.2009.52
Filename
5197025
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