DocumentCode
49700
Title
Broadband permittivity measurement of dielectric materials using discontinuity in substrate integrated waveguide
Author
Fesharaki, Faezeh ; Akyel, Cevdet ; Wu, Kaijie
Author_Institution
Electr. Eng. Pavillion Lassonde, Poly-Grame Res. Center, Montreal, QC, Canada
Volume
49
Issue
3
fYear
2013
fDate
Jan. 31 2013
Firstpage
194
Lastpage
196
Abstract
The substrate integrated waveguide (SIW) is exploited for the broadband determination of the complex dielectric permittivity of lossy material. The effective measurement frequency covers the passband of the fundamental mode in the SIW. This method is an operative technique for characterising the material in millimetre-waves.
Keywords
dielectric materials; millimetre wave measurement; permittivity measurement; substrate integrated waveguides; SIW; broadband determination; broadband permittivity measurement; complex dielectric permittivity; dielectric lossy material measurement; frequency measurement; millimetre-wave measurement; substrate integrated waveguide;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el.2012.3988
Filename
6457566
Link To Document