Title :
Broadband permittivity measurement of dielectric materials using discontinuity in substrate integrated waveguide
Author :
Fesharaki, Faezeh ; Akyel, Cevdet ; Wu, Kaijie
Author_Institution :
Electr. Eng. Pavillion Lassonde, Poly-Grame Res. Center, Montreal, QC, Canada
Abstract :
The substrate integrated waveguide (SIW) is exploited for the broadband determination of the complex dielectric permittivity of lossy material. The effective measurement frequency covers the passband of the fundamental mode in the SIW. This method is an operative technique for characterising the material in millimetre-waves.
Keywords :
dielectric materials; millimetre wave measurement; permittivity measurement; substrate integrated waveguides; SIW; broadband determination; broadband permittivity measurement; complex dielectric permittivity; dielectric lossy material measurement; frequency measurement; millimetre-wave measurement; substrate integrated waveguide;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2012.3988
