DocumentCode
497027
Title
The Scattering Study of Rough Surface by Ray Tracing Technique
Author
Wen, Xiaoyang ; Wang, Chao ; Zhang, Hong
Author_Institution
Cold & Arid Regions Environ. & Eng. Res. Inst., Chinese Acad. of Sci., Lanzhou, China
Volume
2
fYear
2009
fDate
4-5 July 2009
Firstpage
704
Lastpage
707
Abstract
The model of soil surface scattering is implemented in the paper. The ray tracing (RT) model is introduced to solve the soil scattering problem. The soil surface is characterized by the rms of its height distribution relating to wavelength and by the space correlation length of an extracted profile from this surface. The RT result is compared with Kirchhoff approximation (KA) result, and the result matches well.
Keywords
ray tracing; surface roughness; Kirchhoff approximation; height distribution; ray tracing technique; rough surface; scattering study; soil surface scattering; space correlation length; Electromagnetic scattering; Geoscience; Kirchhoff´s Law; Optical scattering; Optical surface waves; Ray tracing; Rough surfaces; Soil; Surface roughness; Surface waves; SAR; high frequency; ray tracing; rough surface; scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Environmental Science and Information Application Technology, 2009. ESIAT 2009. International Conference on
Conference_Location
Wuhan
Print_ISBN
978-0-7695-3682-8
Type
conf
DOI
10.1109/ESIAT.2009.552
Filename
5199990
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