DocumentCode :
49711
Title :
Network Reliability Modeling Under Stochastic Process of Component Failures
Author :
Zarezadeh, Somayeh ; Asadi, Meysam
Author_Institution :
Dept. of Stat., Univ. of Isfahan, Isfahan, Iran
Volume :
62
Issue :
4
fYear :
2013
fDate :
Dec. 2013
Firstpage :
917
Lastpage :
929
Abstract :
The concept of D-spectrum is a useful tool to investigate the reliability and stochastic properties of networks. In this paper, we consider a network consisting of n components (links or nodes), and assume that the network has two states: up, and down. We study the D-spectrum-based reliability of the network under the assumption that the components are subject to failure according to a counting process. Mixture representation of the reliability of the network lifetime is given in terms of the reliability functions of arrival times. It is shown that, when the D-spectra of two networks are stochastically ordered, then under some conditions the lifetimes of two networks are also stochastically ordered. Under the special case when the process of the failure of the components is a nonhomogeneous Poisson process, we arrive at a mixture representation for the reliability function of the network lifetime, and explore several stochastic and aging properties of the network lifetime under different scenarios. The failure rate of the network lifetime and its asymptotic behavior is investigated. D-spectrum based representation theorems are also given on the basis of the stochastic precedence concept.
Keywords :
stochastic processes; telecommunication network reliability; D-spectrum-based reliability; aging properties; component failures; network lifetime; network reliability modeling; nonhomogeneous Poisson process; reliability function; stochastic process; Boolean functions; Computer network reliability; Data structures; Random variables; Stochastic processes; Telecommunication network reliability; D-spectrum; increasing failure rate; non homogeneous Poisson process; record values; stochastic ordering; stochastic precedence; system signature; two-state networks;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2013.2285054
Filename :
6631510
Link To Document :
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