DocumentCode
497159
Title
Guiding principles toward future gate stacks given by the construction of new physical concepts
Author
Shiraishi, Kenji
Author_Institution
Grad. Sch. of Pure & Appl. Sci., Univ. of Tsukuba, Tsukuba, Japan
fYear
2009
fDate
16-18 June 2009
Firstpage
196
Lastpage
197
Abstract
Recent LSI technologies require the introduction of a wide variety of materials and structures in addition to conventional aggressive down-scaling. As a result, present semiconductor devices contain various kinds of nano-scale interfaces and nano-structures. In this paper, we show that conventional physics concepts cannot be applied directly to these interfaces or structures and that construction of new physical concepts is crucial for establishing guiding principles toward future LSIs. In fact, we have succeeded in controlling effective gate work functions of high-k gate stacks based on our new interface physics concepts of "Oxygen vacancy induced Fermi level pinning". Moreover, we also propose guiding principles toward future Si nanowire (NW) FET based on atomic and electronic structures of Si NW.
Keywords
integrated circuit design; large scale integration; nanoelectronics; LSI technologies; atomic structures; conventional aggressive down-scaling; effective gate work functions; electronic structures; future gate stacks; guiding principles; high-k gate stacks; nano-scale interfaces; nano-structures; nanowire FET; oxygen vacancy induced Fermi level pinning; semiconductor devices; Dielectric substrates; Electrons; Hafnium oxide; High K dielectric materials; High-K gate dielectrics; Nanoscale devices; Oxygen; Physics; Schottky barriers; Semiconductor device modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology, 2009 Symposium on
Conference_Location
Honolulu, HI
Print_ISBN
978-1-4244-3308-7
Type
conf
Filename
5200596
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