DocumentCode :
497159
Title :
Guiding principles toward future gate stacks given by the construction of new physical concepts
Author :
Shiraishi, Kenji
Author_Institution :
Grad. Sch. of Pure & Appl. Sci., Univ. of Tsukuba, Tsukuba, Japan
fYear :
2009
fDate :
16-18 June 2009
Firstpage :
196
Lastpage :
197
Abstract :
Recent LSI technologies require the introduction of a wide variety of materials and structures in addition to conventional aggressive down-scaling. As a result, present semiconductor devices contain various kinds of nano-scale interfaces and nano-structures. In this paper, we show that conventional physics concepts cannot be applied directly to these interfaces or structures and that construction of new physical concepts is crucial for establishing guiding principles toward future LSIs. In fact, we have succeeded in controlling effective gate work functions of high-k gate stacks based on our new interface physics concepts of "Oxygen vacancy induced Fermi level pinning". Moreover, we also propose guiding principles toward future Si nanowire (NW) FET based on atomic and electronic structures of Si NW.
Keywords :
integrated circuit design; large scale integration; nanoelectronics; LSI technologies; atomic structures; conventional aggressive down-scaling; effective gate work functions; electronic structures; future gate stacks; guiding principles; high-k gate stacks; nano-scale interfaces; nano-structures; nanowire FET; oxygen vacancy induced Fermi level pinning; semiconductor devices; Dielectric substrates; Electrons; Hafnium oxide; High K dielectric materials; High-K gate dielectrics; Nanoscale devices; Oxygen; Physics; Schottky barriers; Semiconductor device modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, 2009 Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-3308-7
Type :
conf
Filename :
5200596
Link To Document :
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