• DocumentCode
    497159
  • Title

    Guiding principles toward future gate stacks given by the construction of new physical concepts

  • Author

    Shiraishi, Kenji

  • Author_Institution
    Grad. Sch. of Pure & Appl. Sci., Univ. of Tsukuba, Tsukuba, Japan
  • fYear
    2009
  • fDate
    16-18 June 2009
  • Firstpage
    196
  • Lastpage
    197
  • Abstract
    Recent LSI technologies require the introduction of a wide variety of materials and structures in addition to conventional aggressive down-scaling. As a result, present semiconductor devices contain various kinds of nano-scale interfaces and nano-structures. In this paper, we show that conventional physics concepts cannot be applied directly to these interfaces or structures and that construction of new physical concepts is crucial for establishing guiding principles toward future LSIs. In fact, we have succeeded in controlling effective gate work functions of high-k gate stacks based on our new interface physics concepts of "Oxygen vacancy induced Fermi level pinning". Moreover, we also propose guiding principles toward future Si nanowire (NW) FET based on atomic and electronic structures of Si NW.
  • Keywords
    integrated circuit design; large scale integration; nanoelectronics; LSI technologies; atomic structures; conventional aggressive down-scaling; effective gate work functions; electronic structures; future gate stacks; guiding principles; high-k gate stacks; nano-scale interfaces; nano-structures; nanowire FET; oxygen vacancy induced Fermi level pinning; semiconductor devices; Dielectric substrates; Electrons; Hafnium oxide; High K dielectric materials; High-K gate dielectrics; Nanoscale devices; Oxygen; Physics; Schottky barriers; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 2009 Symposium on
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4244-3308-7
  • Type

    conf

  • Filename
    5200596