• DocumentCode
    497244
  • Title

    A metallic-CNT-tolerant carbon nanotube technology using Asymmetrically-Correlated CNTs (ACCNT)

  • Author

    Lin, Albert ; Patil, Nishant ; Wei, Hai ; Mitra, Subhasish ; Wong, H. -S Philip

  • Author_Institution
    Stanford Univ., Stanford, CA, USA
  • fYear
    2009
  • fDate
    16-18 June 2009
  • Firstpage
    182
  • Lastpage
    183
  • Abstract
    We demonstrate carbon nanotube field effect transistors (CNFETs) using asymmetrically-correlated carbon nanotubes (ACCNT, pronounced ldquoaccentrdquo), the first demonstration of a VLSI-compatible metallic-CNT-tolerant design methodology. ACCNT CNFETs take advantage of the asymmetric correlation of CNFETs fabricated on aligned carbon nanotubes to achieve both high Ion/Ioff (up to 5 times 104) and high current drive (~10 + muA). We can increase metallic-CNTtolerance arbitrarily close to 100% (we easily attain 90+% in the results); in comparison, a conventional CNFET design with similar Ion was only at 19%. More than 200 ACCNT test structures and CNFETs were fabricated to demonstrate and validate the ACCNT concepts.
  • Keywords
    VLSI; carbon nanotubes; field effect transistors; ACCNT; VLSI; asymmetrically-correlated CNT; carbon nanotube field effect transistors; carbon nanotube technology; metallic-CNT; Capacitance; Carbon nanotubes; Circuit testing; Degradation; Displays; Drives; Electric variables measurement; Joining processes; Semiconductivity; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, 2009 Symposium on
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4244-3308-7
  • Type

    conf

  • Filename
    5200681