DocumentCode :
497244
Title :
A metallic-CNT-tolerant carbon nanotube technology using Asymmetrically-Correlated CNTs (ACCNT)
Author :
Lin, Albert ; Patil, Nishant ; Wei, Hai ; Mitra, Subhasish ; Wong, H. -S Philip
Author_Institution :
Stanford Univ., Stanford, CA, USA
fYear :
2009
fDate :
16-18 June 2009
Firstpage :
182
Lastpage :
183
Abstract :
We demonstrate carbon nanotube field effect transistors (CNFETs) using asymmetrically-correlated carbon nanotubes (ACCNT, pronounced ldquoaccentrdquo), the first demonstration of a VLSI-compatible metallic-CNT-tolerant design methodology. ACCNT CNFETs take advantage of the asymmetric correlation of CNFETs fabricated on aligned carbon nanotubes to achieve both high Ion/Ioff (up to 5 times 104) and high current drive (~10 + muA). We can increase metallic-CNTtolerance arbitrarily close to 100% (we easily attain 90+% in the results); in comparison, a conventional CNFET design with similar Ion was only at 19%. More than 200 ACCNT test structures and CNFETs were fabricated to demonstrate and validate the ACCNT concepts.
Keywords :
VLSI; carbon nanotubes; field effect transistors; ACCNT; VLSI; asymmetrically-correlated CNT; carbon nanotube field effect transistors; carbon nanotube technology; metallic-CNT; Capacitance; Carbon nanotubes; Circuit testing; Degradation; Displays; Drives; Electric variables measurement; Joining processes; Semiconductivity; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology, 2009 Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-3308-7
Type :
conf
Filename :
5200681
Link To Document :
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