Research on Thickness Measurement of Transparent Object Based on CCD Vision System

Author

Yang Ni ; Wang Yu-tian ; Lv Jiang-tao ; Li Huan-huan

Author_Institution

MTI Key Lab. of Hebei Province, Yanshan Univ., Qinhuangdao, China

Volume

1

fYear

2009

fDate

11-12 April 2009

Firstpage

113

Lastpage

116

Abstract

Novel thickness measurement of transparent object based on line-structured laser and CCD vision technique is present in this paper. The measurement of light stripe image distance is transformed from the measurement of thickness. This article focuses on the experiment design, and the factors that influence accuracy of measurement are discussed as well. The research with positive laboratory verification has proven the feasibility and validity of photoelectric measurement of transparent object thickness. The resolution of thickness measurement can be 8.2 mum.

Keywords

CCD image sensors; design of experiments; distance measurement; thickness measurement; CCD vision system; light stripe image distance measurement; line-structured laser; photoelectric measurement; thickness measurement resolution; transparent object thickness; Charge coupled devices; Image edge detection; Laser beams; Machine vision; Optical interferometry; Optical mixing; Optical refraction; Optical scattering; Surface emitting lasers; Thickness measurement; CCD; central orientation; thickness; transparent object;

fLanguage

English

Publisher

ieee

Conference_Titel

Measuring Technology and Mechatronics Automation, 2009. ICMTMA '09. International Conference on

Conference_Location

Zhangjiajie, Hunan

Print_ISBN

978-0-7695-3583-8

Type

conf

DOI

10.1109/ICMTMA.2009.594

Filename

5202926