• DocumentCode
    497281
  • Title

    Development of Non-contact Surface Roughness Measurement in Last Decades

  • Author

    Xu, XiaoMei ; Hu, Hong

  • Author_Institution
    Shenzhen Grad. Sch., Harbin Inst. of Technol., Shenzhen, China
  • Volume
    1
  • fYear
    2009
  • fDate
    11-12 April 2009
  • Firstpage
    210
  • Lastpage
    213
  • Abstract
    Surface roughness measurement is widely required in the quality assurance of manufacturing processes. And a number of surface roughness measurement methods have been developed since long ago. This paper introduces four kind typical non-contact measurement methods, which have been widely investigated in the last decades for precise measurement. They are microscopes methods, interferometry methods, diffraction methods, and methods based on scattering modeling. Methods of each kind are reviewed, furthermore the advantages and disadvantages of each kind are analyzed.
  • Keywords
    diffraction; interferometry; quality assurance; surface roughness; diffraction methods; interferometry methods; manufacturing processes; microscopes methods; noncontact surface roughness measurement; quality assurance; scattering modeling; Atomic force microscopy; Instruments; Optical interferometry; Optical microscopy; Optical scattering; Rough surfaces; Scanning electron microscopy; Surface roughness; Surface topography; Transmission electron microscopy; diffraction; interferometry; microscope; scattering modeling; surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Measuring Technology and Mechatronics Automation, 2009. ICMTMA '09. International Conference on
  • Conference_Location
    Zhangjiajie, Hunan
  • Print_ISBN
    978-0-7695-3583-8
  • Type

    conf

  • DOI
    10.1109/ICMTMA.2009.584
  • Filename
    5202949