DocumentCode
497281
Title
Development of Non-contact Surface Roughness Measurement in Last Decades
Author
Xu, XiaoMei ; Hu, Hong
Author_Institution
Shenzhen Grad. Sch., Harbin Inst. of Technol., Shenzhen, China
Volume
1
fYear
2009
fDate
11-12 April 2009
Firstpage
210
Lastpage
213
Abstract
Surface roughness measurement is widely required in the quality assurance of manufacturing processes. And a number of surface roughness measurement methods have been developed since long ago. This paper introduces four kind typical non-contact measurement methods, which have been widely investigated in the last decades for precise measurement. They are microscopes methods, interferometry methods, diffraction methods, and methods based on scattering modeling. Methods of each kind are reviewed, furthermore the advantages and disadvantages of each kind are analyzed.
Keywords
diffraction; interferometry; quality assurance; surface roughness; diffraction methods; interferometry methods; manufacturing processes; microscopes methods; noncontact surface roughness measurement; quality assurance; scattering modeling; Atomic force microscopy; Instruments; Optical interferometry; Optical microscopy; Optical scattering; Rough surfaces; Scanning electron microscopy; Surface roughness; Surface topography; Transmission electron microscopy; diffraction; interferometry; microscope; scattering modeling; surface roughness;
fLanguage
English
Publisher
ieee
Conference_Titel
Measuring Technology and Mechatronics Automation, 2009. ICMTMA '09. International Conference on
Conference_Location
Zhangjiajie, Hunan
Print_ISBN
978-0-7695-3583-8
Type
conf
DOI
10.1109/ICMTMA.2009.584
Filename
5202949
Link To Document