DocumentCode :
497281
Title :
Development of Non-contact Surface Roughness Measurement in Last Decades
Author :
Xu, XiaoMei ; Hu, Hong
Author_Institution :
Shenzhen Grad. Sch., Harbin Inst. of Technol., Shenzhen, China
Volume :
1
fYear :
2009
fDate :
11-12 April 2009
Firstpage :
210
Lastpage :
213
Abstract :
Surface roughness measurement is widely required in the quality assurance of manufacturing processes. And a number of surface roughness measurement methods have been developed since long ago. This paper introduces four kind typical non-contact measurement methods, which have been widely investigated in the last decades for precise measurement. They are microscopes methods, interferometry methods, diffraction methods, and methods based on scattering modeling. Methods of each kind are reviewed, furthermore the advantages and disadvantages of each kind are analyzed.
Keywords :
diffraction; interferometry; quality assurance; surface roughness; diffraction methods; interferometry methods; manufacturing processes; microscopes methods; noncontact surface roughness measurement; quality assurance; scattering modeling; Atomic force microscopy; Instruments; Optical interferometry; Optical microscopy; Optical scattering; Rough surfaces; Scanning electron microscopy; Surface roughness; Surface topography; Transmission electron microscopy; diffraction; interferometry; microscope; scattering modeling; surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Measuring Technology and Mechatronics Automation, 2009. ICMTMA '09. International Conference on
Conference_Location :
Zhangjiajie, Hunan
Print_ISBN :
978-0-7695-3583-8
Type :
conf
DOI :
10.1109/ICMTMA.2009.584
Filename :
5202949
Link To Document :
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