Title :
A novel feature line segment approach for pattern classification
Author :
Yang, Yi ; Han, Chongzhao ; Han, Deqiang
Author_Institution :
Inst. of Integrated Autom., Xi´´an Jiaotong Univ., Xi´´an, China
Abstract :
In this paper, a novel pattern classification approach is proposed called shortest feature line segment (SFLS). It retains the ideas and advantages of nearest feature line (NFL) and it can suppress the drawbacks of NFL, i.e., the extrapolation inaccuracy, interpolation inaccuracy and high computational complexity. SFLS uses length of the feature line segment satisfying given geometric relation constraints, instead of the perpendicular distance from query point to feature line in NFL. SFLS has clear geometric-theory foundation and its implementation is relatively simple. In experiments based on artificial datasets and real-world datasets, comparisons between SFLS and other classification methods are provided, including nearest neighbor (NN), k-NN, NFL and some refined NFL methods. Experimental results show that SFLS is a simple yet effective classification approach.
Keywords :
geometry; interpolation; learning (artificial intelligence); pattern classification; computational complexity; extrapolation inaccuracy; geometric-theory foundation; interpolation inaccuracy; nearest feature line; nearest neighbor; pattern classification; shortest feature line segment; Automation; Computational complexity; Error analysis; Extrapolation; Face recognition; Information retrieval; Interpolation; Nearest neighbor searches; Neural networks; Pattern classification; Classification; extrapolation inaccuracy; interpolation inaccuracy; nearest feature line (NFL); nearest neighbor (NN);
Conference_Titel :
Information Fusion, 2009. FUSION '09. 12th International Conference on
Conference_Location :
Seattle, WA
Print_ISBN :
978-0-9824-4380-4