DocumentCode
498023
Title
A 45nm 0.6V cross-point 8T SRAM with negative biased read/write assist
Author
Yabuuchi, M. ; Nii, K. ; Tsukamoto, Y. ; Ohbayashi, S. ; Nakase, Y. ; Shinohara, H.
Author_Institution
Renesas Technology Corp., 4-1, Mizuhara, Itami, Hyogo, Japan
fYear
2009
fDate
16-18 June 2009
Firstpage
158
Lastpage
159
Abstract
We propose a new design solution for embedded SRAM macros with cross point 8T-SRAM for low operating voltage and power. A negative bias technique for VSS and bitline (BL) enables us to achieve not only low power and high access speed, but also the large cell stability and write ability. Using 45-nm CMOS technology, we fabricated the SRAM macro based on our proposal and confirmed that the 1Mbit-SRAM successfully operated at 0.6V. The active power is reduced by 66%, compared to the conventional 6T-SRAM.
Keywords
CMOS technology; Capacitance; Circuit stability; Dynamic voltage scaling; Energy consumption; Frequency; Low voltage; Proposals; Random access memory; Variable structure systems; 45nm; 8T; DVFS; SRAM; assist circuit; cross point;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Circuits, 2009 Symposium on
Conference_Location
Kyoto, Japan
Print_ISBN
978-1-4244-3307-0
Electronic_ISBN
978-4-86348-001-8
Type
conf
Filename
5205389
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