• DocumentCode
    498023
  • Title

    A 45nm 0.6V cross-point 8T SRAM with negative biased read/write assist

  • Author

    Yabuuchi, M. ; Nii, K. ; Tsukamoto, Y. ; Ohbayashi, S. ; Nakase, Y. ; Shinohara, H.

  • Author_Institution
    Renesas Technology Corp., 4-1, Mizuhara, Itami, Hyogo, Japan
  • fYear
    2009
  • fDate
    16-18 June 2009
  • Firstpage
    158
  • Lastpage
    159
  • Abstract
    We propose a new design solution for embedded SRAM macros with cross point 8T-SRAM for low operating voltage and power. A negative bias technique for VSS and bitline (BL) enables us to achieve not only low power and high access speed, but also the large cell stability and write ability. Using 45-nm CMOS technology, we fabricated the SRAM macro based on our proposal and confirmed that the 1Mbit-SRAM successfully operated at 0.6V. The active power is reduced by 66%, compared to the conventional 6T-SRAM.
  • Keywords
    CMOS technology; Capacitance; Circuit stability; Dynamic voltage scaling; Energy consumption; Frequency; Low voltage; Proposals; Random access memory; Variable structure systems; 45nm; 8T; DVFS; SRAM; assist circuit; cross point;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits, 2009 Symposium on
  • Conference_Location
    Kyoto, Japan
  • Print_ISBN
    978-1-4244-3307-0
  • Electronic_ISBN
    978-4-86348-001-8
  • Type

    conf

  • Filename
    5205389