DocumentCode :
498029
Title :
A 0.75V CMOS image sensor using time-based readout circuit
Author :
Cho, Kunhee ; Lee, Dongmyung ; Lee, Jeonghwan ; Han, Gunhee
Author_Institution :
Department of Electrical and Electronic Engineering, Yonsei University, Seoul, Korea
fYear :
2009
fDate :
16-18 June 2009
Firstpage :
178
Lastpage :
179
Abstract :
This paper proposes a low-voltage CMOS image sensor (CIS) using time-based readout (TBR) circuit. This TBR circuit reads out the moment of event from pixel instead of the voltage signal. This allows the use of low supply voltage in pixel with sufficient signal range. The prototype chip was fabricated with a 0.13-µm standard CMOS process and whole circuit uses thin-oxide gate transistors only. The measurement results show 54.2-dB dynamic range and 1.6-µW pixel power consumption in 0.75-V supply voltage. The fill factor is 38% in 3.4-µm pixel pitch.
Keywords :
CMOS image sensors; CMOS process; Circuits; Computational Intelligence Society; Dynamic range; Energy consumption; Low voltage; Power measurement; Prototypes; Semiconductor device measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits, 2009 Symposium on
Conference_Location :
Kyoto, Japan
Print_ISBN :
978-1-4244-3307-0
Electronic_ISBN :
978-4-86348-001-8
Type :
conf
Filename :
5205395
Link To Document :
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