Title :
An all-in-one silicon Odometer for separately monitoring HCI, BTI, and TDDB
Author :
Keane, John ; Persaud, Devin ; Kim, Chris H.
Author_Institution :
Dept. of ECE, University of Minnesota, 200 Union Street SE, Minneapolis, 55455, USA
Abstract :
An on-chip reliability monitor capable of separating the aging effects of HCI, BTI, and TDDB with sub-ps precision is presented. A pair of stressed ring oscillators is implemented in which one ages due to both BTI and HCI, while the other suffers from only BTI. Frequency degradation is monitored with a beat frequency detection system achieving sub-μ s measurement times. Measurement results are presented from a 65nm test chip over a range of stress conditions.
Keywords :
Aging; Degradation; Frequency measurement; Human computer interaction; Monitoring; Ring oscillators; Semiconductor device measurement; Silicon; Stress measurement; Testing;
Conference_Titel :
VLSI Circuits, 2009 Symposium on
Conference_Location :
Kyoto, Japan
Print_ISBN :
978-1-4244-3307-0
Electronic_ISBN :
978-4-86348-001-8
