• DocumentCode
    498040
  • Title

    Tunable replica circuits and adaptive voltage-frequency techniques for dynamic voltage, temperature, and aging variation tolerance

  • Author

    Tschanz, James ; Bowman, Keith ; Walstra, Steve ; Agostinelli, Marty ; Karnik, Tanay ; De, Vibek

  • Author_Institution
    Circuits Research Lab, USA
  • fYear
    2009
  • fDate
    16-18 June 2009
  • Firstpage
    112
  • Lastpage
    113
  • Abstract
    Tunable replica circuits are used in conjunction with error-detection sequentials and dynamic voltage and frequency techniques to adapt to voltage, temperature, and aging variations. Measurements on a 45nm test chip demonstrate the delay sensitivity of replica circuits to voltage, temperature, and AC/AC stress and recovery.
  • Keywords
    Aging; Temperature; Tunable circuits and devices; Very large scale integration; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits, 2009 Symposium on
  • Conference_Location
    Kyoto, Japan
  • Print_ISBN
    978-1-4244-3307-0
  • Electronic_ISBN
    978-4-86348-001-8
  • Type

    conf

  • Filename
    5205410
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=498040