Title :
Tunable replica circuits and adaptive voltage-frequency techniques for dynamic voltage, temperature, and aging variation tolerance
Author :
Tschanz, James ; Bowman, Keith ; Walstra, Steve ; Agostinelli, Marty ; Karnik, Tanay ; De, Vibek
Author_Institution :
Circuits Research Lab, USA
Abstract :
Tunable replica circuits are used in conjunction with error-detection sequentials and dynamic voltage and frequency techniques to adapt to voltage, temperature, and aging variations. Measurements on a 45nm test chip demonstrate the delay sensitivity of replica circuits to voltage, temperature, and AC/AC stress and recovery.
Keywords :
Aging; Temperature; Tunable circuits and devices; Very large scale integration; Voltage;
Conference_Titel :
VLSI Circuits, 2009 Symposium on
Conference_Location :
Kyoto, Japan
Print_ISBN :
978-1-4244-3307-0
Electronic_ISBN :
978-4-86348-001-8
