• DocumentCode
    498042
  • Title

    Silicon Physical Unclonable Function resistant to a 1025-trial brute force attack in 90 nm CMOS

  • Author

    Stanzione, S. ; Iannaccone, G.

  • Author_Institution
    Dipartimento di Ingegneria dell´´Informazione: Elettronica, Informatica, Telecomunicazioni, UniversitÃ\xa0 di Pisa Via Caruso 16, 56122, Italy
  • fYear
    2009
  • fDate
    16-18 June 2009
  • Firstpage
    116
  • Lastpage
    117
  • Abstract
    A CMOS 90 nm physical unclonable function (PUF) based on analog signal processing and process variability has been realized, resistant to a brute force attack of more than 1025 trials. Experimental measurements show that the circuit exhibits 38 µW power consumption. Process and temperature monitor and compensator keep the experimental BER below 0.1% at 125°C or with a 10% VDD variation, with excellent accelerated aging behavior.
  • Keywords
    Accelerated aging; Bit error rate; CMOS process; Circuits; Energy consumption; Power measurement; Signal processing; Silicon; Temperature measurement; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits, 2009 Symposium on
  • Conference_Location
    Kyoto, Japan
  • Print_ISBN
    978-1-4244-3307-0
  • Electronic_ISBN
    978-4-86348-001-8
  • Type

    conf

  • Filename
    5205412
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=498042