Title :
Nonlinear Switching With Ultralow Reset Power in Graphene-Insulator-Graphene Forming-Free Resistive Memories
Author :
Chakrabarti, B. ; Roy, Tonmoy ; Vogel, Eric M.
Author_Institution :
Univ. of Texas at Dallas, Richardson, TX, USA
Abstract :
A high-performance resistive random access memory with graphene top and bottom electrodes and TiOx/Al2O3/TiO2 dielectric stacks is reported. The devices exhibit forming-free switching with stable operation at sub-μA operating current. The switching is highly nonlinear with rectifying characteristics in the sub-μA regime. As a result, the reset current is orders of magnitude smaller than the current compliance. Due to the increasing nonlinearity with decreasing current compliance, the reset current is ~100 pA or less for the current compliance of 180 nA. Overall, the devices demonstrate sub-μA operating current, sub-nW reset power, ON/OFF ratio of ~104, stable dc endurance for more than 200 dc cycles, and stable retention up to 104 s. The rectifying characteristic offers potential to reduce sneak-currents in cross-bar architectures.
Keywords :
aluminium compounds; graphene; random-access storage; switching circuits; titanium compounds; C; DC endurance; TiOx-Al2O3-TiO2; cross bar architecture; dielectric stacks; forming free switching; graphene bottom electrode; graphene top electrode; graphene-insulator-graphene forming-free resistive memory; nonlinear switching; rectifying characteristic; resistive random access memory; ultralow reset power; Aluminum oxide; Dielectrics; Electrodes; Graphene; Ions; Random access memory; Switches; RRAM; forming-free; graphene; non-linearity; ultra-low power; ultra-low power.;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2014.2321328