Title :
Development of a compressive programmable array microscope
Author :
Wu, Y. ; Chen, C. ; Ye, P. ; Arce, G.R. ; Prather, D.W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Delaware, Newark, DE, USA
Abstract :
We present a compressive programmable array microscope design, which incorporates the compressive sensing principle into the patterned illumination microscope design, so that single pixel detectors can be used to capture microscopic images without mechanical scanning.
Keywords :
compressive testing; image reconstruction; optical microscopy; compressive programmable array microscope; compressive sensing; mechanical scanning; microscopic images; patterned illumination microscope design; single pixel detectors; Detectors; Image coding; Image reconstruction; Lighting; Mirrors; Optical arrays; Optical design; Optical microscopy; Pixel; Sensor arrays; (110.0180) Microscopy; (110.3010) Image reconstruction techniques;
Conference_Titel :
Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-55752-869-8
Electronic_ISBN :
978-1-55752-869-8
