Title :
Broadband heterodyne NSOM characterization of propagation loss in waveguide bends
Author :
Ayache, Maurice ; Abashin, Maxim ; Tan, Dawn T H ; Fainman, Yeshaiahu
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California, La Jolla, CA, USA
Abstract :
We use a heterodyne NSOM with superluminescent diode illumination to measure the loss in an SOI waveguide around a bend. For a bend of radius 10 mum, we measure loss of 0.09 dB.
Keywords :
near-field scanning optical microscopy; optical loss measurement; optical waveguides; silicon-on-insulator; superluminescent diodes; SOI waveguide; broadband heterodyne NSOM characterization; loss 0.09 dB; loss measurement; near-field scanning optical microscope; propagation loss; radius 10 mum; superluminescent diode illumination; waveguide bends; Loss measurement; Optical microscopy; Optical mixing; Optical propagation; Optical scattering; Optical surface waves; Optical waveguides; Propagation losses; Space vector pulse width modulation; Superluminescent diodes; (180.4243) Near-field microscopy; (230.7370) Waveguides;
Conference_Titel :
Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-55752-869-8
Electronic_ISBN :
978-1-55752-869-8
