DocumentCode :
49947
Title :
Layout-Versus-Schematic Verification for Superconductive Integrated Circuits
Author :
Roberts, Rebecca M. C. ; Fourie, Coenrad J.
Author_Institution :
Stellenbosch Univ., Stellenbosch, South Africa
Volume :
25
Issue :
3
fYear :
2015
fDate :
Jun-15
Firstpage :
1
Lastpage :
5
Abstract :
Thorough layout verification of superconducting integrated circuits goes beyond design rule checking and parameter value extraction. The former is used to verify adherence to process design rules, and the latter to determine component element values. Still, neither gives much warning against subtle layout errors that result in unintended parasitic elements, or a layout that does not reflect the original circuit topology. A specialized implementation for Cadence Virtuoso allows layout-versus-schematic (LVS) verification, but is limited to commercial software and in terms of usefulness. Parameter extraction software such as InductEx require the circuit topology to be provided as a netlist, and element values are extracted for this topology even if a mistake in the layout or the netlist results in a model mismatch. Here we present a free-standing LVS verification toolkit for superconductive integrated circuits, and discuss its implementation. It comprises layout-to-schematic conversion that creates a first-pass netlist, netlist simplification, netlist and schematic visualization for user feedback, and netlist comparison to determine if a layout agrees with an input schematic. We show results for gate-level layouts and how it is used with InductEx to perform automated parameter extraction for layout verification. We conclude that this work makes layout verification more efficient and minimizes layout mistakes.
Keywords :
integrated circuit layout; network topology; superconducting integrated circuits; InductEx; automated parameter extraction; circuit topology; component element values; design rule checking; first-pass netlist; free-standing layout-versus-schematic verification toolkit; gate-level layouts; layout errors; layout-to-schematic conversion; model mismatch; netlist simplification; netlist visualization; parameter extraction software; parasitic elements; process design rules; schematic visualization; superconductive integrated circuits; Design automation; Integrated circuit modeling; Layout; Parameter extraction; Software; Superconductivity; Circuit netlist; layout verification; layout-versus-schematic; superconductive circuit;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2014.2373035
Filename :
6963371
Link To Document :
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