Terahertz electrical measurement of single-walled carbon nanotube transistors

Author

Zhong, Zhaohu ; Gabor, Nathaniel M. ; Sharping, Jay E. ; Gaeta, Alexander L. ; McEuen, Paul L.

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA

fYear

2009

fDate

2-4 June 2009

Firstpage

1

Lastpage

2

Abstract

We describe the first terahertz electrical measurements of single-walled carbon nanotube transistors. A picosecond ballistic electron resonance is directly observed in the time-domain. These results demonstrate a powerful new tool for directly probing picosecond electron motion in nanostructures.

Keywords

carbon nanotubes; resonance; semiconductor device measurement; terahertz wave devices; time-domain analysis; transistors; picosecond ballistic electron resonance; single-walled carbon nanotube transistors; terahertz electrical measurement; time-domain; Carbon nanotubes; Electric variables measurement; Electrons; Optical pulses; Plasmons; Power transmission lines; Resonance; Submillimeter wave measurements; Time measurement; Voltage; (160.4236) Nanomaterials; (300.6495) Spectroscopy, terahertz; (320.7130) Ultrafast processes in condensed matter;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on

Conference_Location

Baltimore, MD

Print_ISBN

978-1-55752-869-8

Electronic_ISBN

978-1-55752-869-8

Type

conf

Filename

5224607