Title :
Low-refractive-index materials - A new class of optical thin-film materials
Author :
Schubert, E.Fred ; Kim, Jong Kyu
Author_Institution :
Electr., Comput., & Syst. Eng. Dept., Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
The refractive index is the most fundamental quantity in optics. However, no optical thin-film materials have been available in the index range 1.05-1.4. A new class of low-index materials is presented including several applications.
Keywords :
nanostructured materials; optical films; optical materials; porosity; refractive index; low-refractive-index material; nanorods array; oblique angle evaporation; oblique-angle deposition; optical thin-film material; porosity; Distributed Bragg reflectors; Fresnel reflection; Indium tin oxide; Optical control; Optical films; Optical materials; Optical refraction; Optical variables control; Physics; Refractive index; (160.4670) Optical materials; (310.6860) Thin films, optical properties;
Conference_Titel :
Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-55752-869-8
Electronic_ISBN :
978-1-55752-869-8
