DocumentCode
499647
Title
Low-refractive-index materials - A new class of optical thin-film materials
Author
Schubert, E.Fred ; Kim, Jong Kyu
Author_Institution
Electr., Comput., & Syst. Eng. Dept., Rensselaer Polytech. Inst., Troy, NY, USA
fYear
2009
fDate
2-4 June 2009
Firstpage
1
Lastpage
2
Abstract
The refractive index is the most fundamental quantity in optics. However, no optical thin-film materials have been available in the index range 1.05-1.4. A new class of low-index materials is presented including several applications.
Keywords
nanostructured materials; optical films; optical materials; porosity; refractive index; low-refractive-index material; nanorods array; oblique angle evaporation; oblique-angle deposition; optical thin-film material; porosity; Distributed Bragg reflectors; Fresnel reflection; Indium tin oxide; Optical control; Optical films; Optical materials; Optical refraction; Optical variables control; Physics; Refractive index; (160.4670) Optical materials; (310.6860) Thin films, optical properties;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on
Conference_Location
Baltimore, MD
Print_ISBN
978-1-55752-869-8
Electronic_ISBN
978-1-55752-869-8
Type
conf
Filename
5224877
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