DocumentCode :
499830
Title :
Polarization-ratio reflectance for determining optical constants using laser high-order harmonics
Author :
Brimhall, Nicole ; Heilmann, Nathan ; Peatross, Justin
Author_Institution :
Dept. of Phys. & Astron., Brigham Young Univ., Provo, UT, USA
fYear :
2009
fDate :
2-4 June 2009
Firstpage :
1
Lastpage :
2
Abstract :
We describe a method for deriving optical constants in the extreme ultraviolet from the measured ratio of p- to s-polarized reflectance curves (as a function of angle). These measurements use laser-generated high-order harmonics, which have the advantage of easily rotatable linear polarization. We show that this ratio technique markedly reduces sensitivity to possible systematic brightness and alignment drifts of the harmonic signal during measurement. We also demonstrate that optical constants can be extracted from ratio reflectance measurements as well as they can from absolute reflectance measurements.
Keywords :
laser beams; light polarisation; measurement by laser beam; optical constants; optical variables measurement; reflectometry; harmonic signal; laser high-order harmonics; optical constant determination; polarization-ratio reflectance measurement; rotatable linear polarization; Extraterrestrial measurements; Nonlinear optics; Optical films; Optical polarization; Optical refraction; Optical saturation; Optical sensors; Reflectivity; Ultraviolet sources; Wavelength measurement; (160.4760) Optical properties; (340.7480) X-rays, soft x-rays, extreme ultraviolet (EUV);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-55752-869-8
Electronic_ISBN :
978-1-55752-869-8
Type :
conf
Filename :
5225191
Link To Document :
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