Title :
EUV detection of high-frequency surface acoustic waves
Author :
Siemens, Mark ; Li, Qing ; Murnane, Margaret ; Kapteyn, Henry ; Yang, Ronggui ; Anderson, Erik ; Nelson, Keith
Author_Institution :
Dept. of Phys., Univ. of Colorado, Boulder, CO, USA
Abstract :
We use coherent extreme ultraviolet radiation to probe surface acoustic wave propagation in nickel-on-sapphire nanostructures. We observe no acoustic dispersion over SAW wavelengths down to 200 nm, meaning the SAW propagation is unaffected by the nanostructure.
Keywords :
light propagation; sapphire; surface acoustic waves; EUV detection; SAW propagation; SAW wavelengths; coherent extreme ultraviolet radiation; high-frequency surface acoustic waves; nickel-on-sapphire nanostructures; surface acoustic wave propagation; Acoustic signal detection; Acoustic waves; Nanostructures; Nickel; Optical films; Optical harmonic generation; Optical sensors; Optical surface waves; Surface acoustic waves; Ultraviolet sources; (240.6690) Surface waves; (320.5390) Picosecond phenomena;
Conference_Titel :
Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-55752-869-8
Electronic_ISBN :
978-1-55752-869-8
