• DocumentCode
    500409
  • Title

    Time-evolution of carriers after multiphoton ionization of bulk dielectrics

  • Author

    Grojo, D. ; Gertsvolf, M. ; Lei, S. ; Rayner, D.M. ; Corkum, P.B.

  • Author_Institution
    Nat. Res. Council, Ottawa, ON, Canada
  • fYear
    2009
  • fDate
    2-4 June 2009
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Using the unique characteristics of multiphoton ionization with focused femtosecond pulses, we report on a pump and probe metrology to analyze carrier dynamics inside dielectrics. We characterize the sub-picosecond trapping of carriers inside fused SiO2.
  • Keywords
    dielectric materials; multiphoton processes; optical materials; photoionisation; silicon compounds; SiO2; bulk dielectrics; multiphoton ionization; time-evolution; Absorption; Dielectrics; Free electron lasers; Ionization; Laser excitation; Optical pulses; Plasma measurements; Probes; Pulse measurements; Pump lasers; (320.7110) Ultrafast nonlinear optics; 190.4180) Multiphoton processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    978-1-55752-869-8
  • Electronic_ISBN
    978-1-55752-869-8
  • Type

    conf

  • Filename
    5225801