DocumentCode
500619
Title
Scattering-probe-imaging of the field confinement on tapered metal-wire waveguides
Author
Astley, Victoria ; Zhan, Hui ; Mendis, Rajind ; Mittleman, Daniel M.
Author_Institution
Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX, USA
fYear
2009
fDate
2-4 June 2009
Firstpage
1
Lastpage
2
Abstract
Using a recently developed scattering-probe-imaging technique, we observe strong confinement of the THz electric field at the end of a tapered metal-wire waveguide compared to an un-tapered wire. This confinement agrees well with FEM simulations.
Keywords
finite element analysis; light scattering; optical images; optical waveguides; terahertz wave devices; FEM simulation; finite element analysis; scattering-probe-imaging technique; tapered metal-wire waveguide; terahertz electric field confinement; terahertz waveguide; Numerical simulation; Optical attenuators; Optical coupling; Optical scattering; Optical waveguide theory; Optical waveguides; Photoconductivity; Probes; Waveguide lasers; Wire; (230.7370) Waveguides; (320.7150) Ultrafast spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2009 and 2009 Conference on Quantum electronics and Laser Science Conference. CLEO/QELS 2009. Conference on
Conference_Location
Baltimore, MD
Print_ISBN
978-1-55752-869-8
Electronic_ISBN
978-1-55752-869-8
Type
conf
Filename
5226033
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