• DocumentCode
    50073
  • Title

    Unsupervised Object Class Discovery via Saliency-Guided Multiple Class Learning

  • Author

    Jun-Yan Zhu ; Jiajun Wu ; Yan Xu ; Chang, Eric ; Zhuowen Tu

  • Author_Institution
    Comput. Sci. Div., Univ. of California at Berkeley, Berkeley, CA, USA
  • Volume
    37
  • Issue
    4
  • fYear
    2015
  • fDate
    April 1 2015
  • Firstpage
    862
  • Lastpage
    875
  • Abstract
    In this paper, we tackle the problem of common object (multiple classes) discovery from a set of input images, where we assume the presence of one object class in each image. This problem is, loosely speaking, unsupervised since we do not know a priori about the object type, location, and scale in each image. We observe that the general task of object class discovery in a fully unsupervised manner is intrinsically ambiguous; here we adopt saliency detection to propose candidate image windows/patches to turn an unsupervised learning problem into a weakly-supervised learning problem. In the paper, we propose an algorithm for simultaneously localizing objects and discovering object classes via bottom-up (saliency-guided) multiple class learning (bMCL). Our contributions are three-fold: (1) we adopt saliency detection to convert unsupervised learning into multiple instance learning, formulated as bottom-up multiple class learning (bMCL); (2) we propose an integrated framework that simultaneously performs object localization, object class discovery, and object detector training; (3) we demonstrate that our framework yields significant improvements over existing methods for multi-class object discovery and possess evident advantages over competing methods in computer vision. In addition, although saliency detection has recently attracted much attention, its practical usage for high-level vision tasks has yet to be justified. Our method validates the usefulness of saliency detection to output “noisy input” for a top-down method to extract common patterns.
  • Keywords
    computer vision; object detection; unsupervised learning; bMCL; bottom-up multiple class learning; computer vision; image location; image patches; image scale; image windows; input image; object class; object detector training; object localization; saliency-guided multiple class learning; unsupervised learning; unsupervised object class discovery; weakly-supervised learning problem; Algorithm design and analysis; Clustering algorithms; Detectors; Electronic mail; Object detection; Training; Unsupervised learning; Unsupervised object discovery; multiple instance learning; object detection; saliency; weakly supervised learning;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2014.2353617
  • Filename
    6888473