DocumentCode
500938
Title
Decoding nanowire arrays fabricated with the Multi-Spacer Patterning Technique
Author
Ben Jamaa, M. Haykel ; Leblebici, Yusuf ; De Micheli, Giovanni
Author_Institution
Swiss Fed. Inst. of Technol. (EPFL), Lausanne, Switzerland
fYear
2009
fDate
26-31 July 2009
Firstpage
77
Lastpage
82
Abstract
Silicon nanowires are a promising solution to address the increasing challenges of fabrication and design at the future nodes of the complementary metal-oxide-semiconductor (CMOS) technology roadmap. Despite the attractive opportunity that offers their organization onto regular crossbars, the problem of designing the nanowire decoder is still challenging and highly dependent on the nanowire fabrication technology. In this paper, we introduce a novel design style and encoding scheme for decoding nanowires fabricated with the multi-spacer-patterning technique (MSPT); and we present a method based on gray codes that reduces the fabrication cost and improves the decoder reliability. We show that by arranging the code in a Gray code fashion, we decrease the fabrication complexity by 17% and the variability by 18% on average. By optimizing the decoder parameters, the simulations showed an improvement of the crossbar yield by 40% and a reduction of the effective bit area by 51% to 169 nm2.
Keywords
CMOS integrated circuits; nanowires; silicon; CMOS; Si; complementary metal-oxide-semiconductor; encoding scheme; gray codes; multispacer patterning technique; nanowire decoding; silicon nanowire; CMOS technology; Circuits; Decoding; Design methodology; Encoding; Fabrication; Fault tolerance; Nanoscale devices; Reflective binary codes; Silicon; Crossbar; Decoder; Emerging Technologies; MSPT; Nanowires; Spacer Technique;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
Conference_Location
San Francisco, CA
ISSN
0738-100X
Print_ISBN
978-1-6055-8497-3
Type
conf
Filename
5227196
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