• DocumentCode
    501479
  • Title

    An analytical expression for the I – V characteristics of AlGaN/GaN HEMTs

  • Author

    Elnaby, M. Abd ; Aziz, M.A. ; Shalaby, Abdel Aziz ; El-Abd, Ali

  • Author_Institution
    Fac. of Eng., Tanta Univ., Tanta, Egypt
  • fYear
    2009
  • fDate
    17-19 March 2009
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    In this paper an analytical expression for the current-voltage (I-V) characteristics of AlGaN/GaN HEMTs is presented. Two functions are suggested to model the dependence of the voltage parameter on drain voltage. The resultant I-V relationship incorporates the 2DEG sheet carrier concentration and mobility product. It also includes the effect of source and drain resistances. The obtained analytical relationship helps speeding up the I-V calculations meanwhile, keeping it simple and accurate. Due to its simplicity, it is ideally suited for circuit simulation purposes. The validity of the I-V results was tested and satisfactory results were obtained over a wide range of bias voltages.
  • Keywords
    aluminium compounds; gallium compounds; high electron mobility transistors; 2DEG sheet carrier concentration; AlGaN-GaN; HEMT; circuit simulation purposes; current-voltage characteristics; drain resistances; drain voltage; mobility product; source resistances; voltage parameter; Aluminum gallium nitride; Circuit simulation; Circuit testing; Conducting materials; Gallium nitride; HEMTs; MODFETs; Sheet materials; Telecommunications; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Science Conference, 2009. NRSC 2009. National
  • Conference_Location
    New Cairo
  • ISSN
    1110-6980
  • Print_ISBN
    978-1-4244-4214-0
  • Type

    conf

  • Filename
    5233482